tint: remove redundant insertBits tests
Meant to remove this in
https://dawn-review.googlesource.com/c/dawn/+/110482
Bug: tint:1581
Bug: chromium:53440
Change-Id: I38a51873b93c2bfbf6ea20456a7992422ead6208
Reviewed-on: https://dawn-review.googlesource.com/c/dawn/+/110446
Commit-Queue: Ben Clayton <bclayton@google.com>
Auto-Submit: Antonio Maiorano <amaiorano@google.com>
Reviewed-by: Ben Clayton <bclayton@google.com>
Kokoro: Kokoro <noreply+kokoro@google.com>
diff --git a/src/tint/resolver/const_eval_builtin_test.cc b/src/tint/resolver/const_eval_builtin_test.cc
index cc950ab..a85f4b6 100644
--- a/src/tint/resolver/const_eval_builtin_test.cc
+++ b/src/tint/resolver/const_eval_builtin_test.cc
@@ -1179,33 +1179,6 @@
testing::ValuesIn(Concat(InsertBitsCases<i32>(), //
InsertBitsCases<u32>()))));
-using ResolverConstEvalBuiltinTest_InsertBits_InvalidOffsetAndCount =
- ResolverTestWithParam<std::tuple<size_t, size_t>>;
-TEST_P(ResolverConstEvalBuiltinTest_InsertBits_InvalidOffsetAndCount, Test) {
- auto& p = GetParam();
- auto* expr = Call(Source{{12, 34}}, sem::str(sem::BuiltinType::kInsertBits), Expr(1_u),
- Expr(1_u), Expr(u32(std::get<0>(p))), Expr(u32(std::get<1>(p))));
- GlobalConst("C", expr);
- EXPECT_FALSE(r()->Resolve());
- EXPECT_EQ(r()->error(),
- "12:34 error: 'offset + 'count' must be less than or equal to the bit width of 'e'");
-}
-INSTANTIATE_TEST_SUITE_P(InsertBits,
- ResolverConstEvalBuiltinTest_InsertBits_InvalidOffsetAndCount,
- testing::Values( //
- std::make_tuple(33, 0), //
- std::make_tuple(34, 0), //
- std::make_tuple(1000, 0), //
- std::make_tuple(u32::Highest(), 0), //
- std::make_tuple(0, 33), //
- std::make_tuple(0, 34), //
- std::make_tuple(0, 1000), //
- std::make_tuple(0, u32::Highest()), //
- std::make_tuple(33, 33), //
- std::make_tuple(34, 34), //
- std::make_tuple(1000, 1000), //
- std::make_tuple(u32::Highest(), u32::Highest())));
-
template <typename T>
std::vector<Case> ExtractBitsCases() {
using UT = Number<std::make_unsigned_t<UnwrapNumber<T>>>;
